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University of Illinois - Urbana-Champaign

Dispersive phonon imaging in III-V semiconductors

Abstract

dc:description

"Low-temperature transport properties of high-frequency acoustic phonons are investigated in GaAs, InSb, InP and InAs using the phonon-imaging technique. In this method, a focused laser beam provides a movable heat source on one side of a cooled crystal (~ 2 K). A single small phonon detector on the opposite face records the transmitted heat flux as a function of propagation direction. Ballistic phonons channel along directions in the crystal which are completely determined by the detailed shape of constant-energy surfaces in wavevector space. The resulting focusing patterns are characterized by sharp phonon caustics which are clearly identified from the continuous background due to scattered phonons. In the dispersive regime, where phonon wavelength is comparable to atomic spacing, the angular positions of these caustic lines are very sensitive to phonon frequency, thus providing a novel test for lattice dynamics theories. Experiments are performed with superconducting tunnel junctions and Al bolometers to probe both the high-frequency and low-frequency regimes, respectively. We find that large-k ballistic phonons give rise to distinct focusing patterns in all four types of crystals, with thicknesses varying between 0.4 and 0.8 mm. Due to isotope scattering in the bulk, tunnel-junction experiments yield well-defined caustic patterns with a dominant frequency given by the detector gap 2.6.. In InSb, where zone boundary frequencies are small ( VT A ""' 1.2 THz), the frequency dependence of the dispersive phonon focusing patterns are Ill measured using PbTl (0.43, 0.59 THz) and PbBi (0.69, 0.73, 0.78, 0.82 THz) tunnel junction detectors. The results are interpreted with Monte Carlo calculations based on rigid, dipole, shell, and bond-charge models. Although each model yields satisfactory fits to the previously measured dispersion curves, the predicted patterns show remarkable differences in the caustic structures. This result underscores the utility of phonon imaging in providing new information about the elastic forces between atoms in crystals."

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Physics
Year dc:date
2011

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Hebboul, Saad Eddine
Contributors dc:contributor
  • Wolfe, J.P.

Subjects

dc:subject × 8

Rights

dc:rights
Statement dc:rights
  • 1988 Saad Eddine Hebboul
Language dc:language
en

Identifiers

dc:identifier.*
Identifier
1855404
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/23923

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Hebboul, Saad Eddine. Dispersive phonon imaging in III-V semiconductors. Dissertation thesis, 2011. http://hdl.handle.net/2142/23923