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University of Illinois Urbana-Champaign

A computer vision-based dimension measurement method for visual inspection system in smart manufacturing

Abstract

dc:description

Accurate dimension inspection is crucial in manufacturing. The proper functionality of the manufactured products is premised on the accurate dimension recognization, localization, and measurement. Traditionally, this task can be conducted by a trained technician. However, as the global electronics market grows and the development of semi-conductor industry progresses, the manufactured products become smaller in size but larger in quantity, which poses a significant challenge to the manufacturers. Thus, developing and deploying an automated inspection system with high accuracy and fidelity is needed to ensure the smooth operation of these manufacturers. In this thesis, I develop a dimension inspection system based on applying computer vision techniques to analyzing the photos of manufactured parts to solve this question. With CAD drawings and sample part images provided by Foxconn Interconnect Technology (FIT), I design a workflow to facilitate the inspection process, from critical feature recognition to data reporting. The backbone of this inspection system is based on image-level signal filtering and geometry detection to ensure the flexibility and generalizability across different CAD designs. The performance of this inspection system was tested on a large dataset of six different dimensions from the USB-C connector FIT manufactures, as well as our proprietary 3D printing dataset, and the result shows the industrial application potential of this system.

Degree

thesis:*
Name thesis:degree_name
M.S.
Level thesis:degree_level
Thesis
Discipline thesis:degree_discipline
Electrical & Computer Engr
Grantor
University of Illinois Urbana-Champaign
Year dc:date
2025

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Liu, Shitao
Contributors dc:contributor
  • Do, Minh N.

Subjects

dc:subject × 4

Rights

dc:rights
Statement dc:rights
  • Copyright 2025 Shitao Liu
Language dc:language
en, eng

Identifiers

dc:identifier.*
Handle dc:identifier
https://hdl.handle.net/2142/129793

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Liu, Shitao. A computer vision-based dimension measurement method for visual inspection system in smart manufacturing. Thesis thesis, University of Illinois Urbana-Champaign, 2025. https://hdl.handle.net/2142/129793