Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 20 of 304 for “"Metrology"”.
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Superhydrophobic metrology and applications
Superhydrophobic surfaces repel water and exhibit useful properties like self-cleaning, anti-fogging, anti-icing, and anti-fouling. Current characterization techniques have trouble grading the superhydrophobicity of samples due to limits in force and optical resolution. Thus, more suitable …
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Attosecond Wave Packet Metrology
Attosecond pulses allow the study of electrons on their natural timescale. They are created from the interaction of atoms with ultrashort, intense laser pulses whose electric field approaches the strength of inner-atomic electric fields. This thesis presents experiments around the generation, …
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Metrology of Reflective Optical Systems
… these surfaces have been fabricated, an accurate metrology process must be available to ensure the fabricated optical and fiducial surfaces conform to the designed surfaces. The goal of this research is to apply metrology techniques to reflective optical systems and their components. A two mirror …
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Metrology of optical telescope components
… of feasibility, repeatability and economy. Two metrology techniques, suitable for measuring small deformations of large in situ telescope structural support members, have been developed for determining the CTE and CME of carbon fiber reinforced epoxy (CFRE) telescope components. Both are …
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Optical metrology of thin films
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1997.
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Virtual metrology for plasma etch processes.
… of relevant and/or regular measurements. Virtual metrology (VM) is the use of mathematical models with accessible measurements from an operating process to estimate variables of interest. This thesis addresses the challenge of virtual metrology for plasma processes, with a particular focus on …
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Quantum metrology with Bose-Einstein condensates
… precision and therefore form the basis of many metrology schemes. Research has shown that by using quantum states as inputs to interferometers, precisions better than anything possible classically can be achieved. Nevertheless, these states are difficult to produce and fragile to particle …
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Noise Metrology in Optical Communication Systems
… networks. The focus on this work is online metrology, where measurements are taken in conjunction with live traffic enabling to detect malfunctioning links and discrepancies between theoretical models and measured results. After covering the theoretical and experimental background, and a …
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Laser metrology system for stellar interferometry
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988.
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New millennium interferometer laser metrology testbed
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997.
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Statistical metrology of interlevel dieletric thickness
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
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Human metrology for person classification and recognition
… chest circumference or foot length. Human metrology provides an important soft biometric that can be used in challenging situations, such as person classification and recognition at a distance, where hard biometric traits such as fingerprints and iris information cannot easily be acquired. …
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Video metrology for documentation of engineering construction
A practical method was developed to calibrate the interior geometry of CCD cameras. The method employs a flat brick wall as a control field. A brick wall is an excellent control field, because it provides a large number of well-defined points at almost any focal setting. When compared with …
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Metrology techniques for compound rotary-linear motion
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001.
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Dynamic nanometer alignment for nanofabrication and metrology
Future generations of IC fabrication depend in part on continued improvements in lithography. To meet the lithographic challenges posed by 25- nm lithography, a novel through-the-mask, interferometric imaging alignment method is described that has demonstrated detectivity below 1 nm. Approximately …
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Octave-spanning lasers for optical metrology applications
… The system developed is suitable for optical metrology applications in general, although the version here presented is locked to the hydrogen 1S-2S transition frequency in ultracold hydrogen. A detailed study of the carrier-envelope phase dynamics and noise characteristics of octave-spanning …
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Metrology of very thin silicon epitaxial films
Thesis (Sc. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
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