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University of Illinois - Urbana-Champaign

Plasma Assisted Cleaning by Electrostatics of Insulating Nanometer Scale Contamination from Materials Used in Integrated Circuit Manufacturing

Abstract

dc:description

Made available in DSpace on 2017-07-06T18:55:12Z (GMT). No. of bitstreams: 3 Lytle_Wayne_M_MS.pdf: 27922220 bytes, checksum: 67faae2239adf87cba4f0a7f443a8456 (MD5) Lytle_Wayne_M_MS_ABS.pdf: 35267 bytes, checksum: 25efd85c0e399395e1a5a857fbd3a791 (MD5) license.txt: 4813 bytes, checksum: 715c4321821a960fa1a1e91d2ac7ebce (MD5) Previous issue date: 2007

Degree

thesis:*
Name thesis:degree_name
M.S. (master's)
Level thesis:degree_level
Thesis
Discipline thesis:degree_discipline
Nuclear, Plasma, and Radiological Engineering
Year dc:date
2017

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Lytle, Wayne M.

Subjects

dc:subject × 6

Rights

dc:rights
Statement dc:rights
  • Copyright 2007 Wayne M. Lytle
Language dc:language
en

Identifiers

dc:identifier.*
Handle dc:identifier
http://hdl.handle.net/2142/96442
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/96442

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Lytle, Wayne M.. Plasma Assisted Cleaning by Electrostatics of Insulating Nanometer Scale Contamination from Materials Used in Integrated Circuit Manufacturing. Thesis thesis, 2017. http://hdl.handle.net/2142/96442