Experimental Investigations of the Electronic Properties of the Oxidized Silicon Surface Using Mos Capacitors

Collins, Dean Robert

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University of Illinois at Urbana-Champaign

Experimental Investigations of the Electronic Properties of the Oxidized Silicon Surface Using Mos Capacitors

dc:creator Collins, Dean Robert

thesis:degree_name Ph.D.

dc:date2014

Abstract

dc:description

Made available in DSpace on 2014-12-08T22:24:10Z (GMT). No. of bitstreams: 1 6711833.pdf: 2934091 bytes, checksum: 65888ef8e8b582129046f8cd5656308b (MD5) Previous issue date: 1967

Degree

thesis:*

Name thesis:degree_name: Ph.D.
Level thesis:degree_level: Dissertation
Discipline thesis:degree_discipline: Electrical Engineering
Grantor: University of Illinois at Urbana-Champaign
Year dc:date: 2014

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Collins, Dean Robert

Subjects

dc:subject × 1

Engineering, Electronics and Electrical

Identifiers

dc:identifier.*

Identifier: (UMI)AAI6711833
OAI identifier oai:identifier: oai:www.ideals.illinois.edu:2142/59649

Chain of custody

source

Harvested from: University of Illinois - Urbana-Champaign
Base URL: www.ideals.illinois.edu/oai-pmh
Last updated: 2026-07-22
Source record: OAI-PMH GetRecord

related terms

citation

Collins, Dean Robert. Experimental Investigations of the Electronic Properties of the Oxidized Silicon Surface Using Mos Capacitors. Dissertation thesis, University of Illinois at Urbana-Champaign, 2014. http://hdl.handle.net/2142/59649

Experimental Investigations of the Electronic Properties of the Oxidized Silicon Surface Using Mos Capacitors

Abstract

Degree

Author and committee

Subjects

Identifiers

Chain of custody

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