Experimental Investigations of the Electronic Properties of the Oxidized Silicon Surface Using Mos Capacitors
type: CreativeWork
description: Made available in DSpace on 2014-12-08T22:24:10Z (GMT). No. of bitstreams: 1 6711833.pdf: 2934091 bytes, checksum: 65888ef8e8b582129046f8cd5656308b (MD5) Previous issue date: 1967
abstract: Made available in DSpace on 2014-12-08T22:24:10Z (GMT). No. of bitstreams: 1 6711833.pdf: 2934091 bytes, checksum: 65888ef8e8b582129046f8cd5656308b (MD5) Previous issue date: 1967
author: Collins, Dean Robert
keywords: Engineering, Electronics and Electrical
date published: 2014-12-08T22:24:10Z
date modified: 2026-07-22T22:25:46Z
provider: University of Illinois - Urbana-Champaign
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: University of Illinois at Urbana-Champaign

PropertyValue
property ID: Handle
value: http://hdl.handle.net/2142/59649