Back to results

University of Illinois at Urbana-Champaign

Optimum gate arrangements for MOS standardized layouts

Abstract

dc:description

Optimization of size is an important topic of research in the engineering of digital circuits. The field effect transistor (FET) is making an important contribution in this area. In this paper, the basic properties of the FET which pertain to digital circuits will be examined. The problems associated with the physical layout of large integrated circuits using FETs will also be discussed and a standardized method of layout will be reviewed. A simple procedure for optimizing chip area when using this standardized layout method will be developed and illustrated.

Degree

thesis:*
Name thesis:degree_name
M.S.
Level thesis:degree_level
Thesis
Discipline thesis:degree_discipline
Electrical Engineering
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2013

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Robbins, David H.
Contributors dc:contributor
  • Mayeda, Watura

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • Copyright 1975 David H. Robbins
Language dc:language
en

Identifiers

dc:identifier.*
Handle dc:identifier
http://hdl.handle.net/2142/45707
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/45707

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Robbins, David H.. Optimum gate arrangements for MOS standardized layouts. Thesis thesis, University of Illinois at Urbana-Champaign, 2013. http://hdl.handle.net/2142/45707