University of Illinois at Urbana-Champaign
Optimum gate arrangements for MOS standardized layouts
Abstract
dc:descriptionOptimization of size is an important topic of research in the engineering of digital circuits. The field effect transistor (FET) is making an important contribution in this area. In this paper, the basic properties of the FET which pertain to digital circuits will be examined. The problems associated with the physical layout of large integrated circuits using FETs will also be discussed and a standardized method of layout will be reviewed. A simple procedure for optimizing chip area when using this standardized layout method will be developed and illustrated.
Degree
thesis:*- Name thesis:degree_name
- M.S.
- Level thesis:degree_level
- Thesis
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2013
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Robbins, David H.
- Contributors dc:contributor
-
- Mayeda, Watura
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- Copyright 1975 David H. Robbins
- Language dc:language
- en
Identifiers
dc:identifier.*- Handle dc:identifier
- http://hdl.handle.net/2142/45707
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/45707