Quantitative nanometer-scale thermal metrology using scanning joule expansion microscopy

Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by William Ingram (wingram2@illinois.edu) on 2011-05-25T14:41:49Z Item is restricted until 2013-05-25T14:41:28Z

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Mechanical Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Grosse, Kyle L.

Contributors dc:contributor

• King, William P.

• scanning Joule expansion microscopy (SJEM)
• atomic force microscope (AFM)
• Nanotechnology
• Temperature measurement
• Graphene
• hot spots
• contact effects
• microelectronics

Statement dc:rights

• Copyright 2011 Kyle Grosse

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/24392

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/24392