{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/24392"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/24392","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Quantitative nanometer-scale thermal metrology using scanning joule expansion microscopy","abstract":"Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by William Ingram (wingram2@illinois.edu) on 2011-05-25T14:41:49Z Item is restricted until 2013-05-25T14:41:28Z","abstract_html":"Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by William Ingram (wingram2@illinois.edu) on 2011-05-25T14:41:49Z Item is restricted until 2013-05-25T14:41:28Z","abstract_has_math":false,"creators":["Grosse, Kyle L."],"institution":"University of Illinois at Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Mechanical Engineering","degree_department":null,"school":null,"contributors":["King, William P."],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2011,"date_issued":"2011-05-25T14:36:58Z","date_published":"2011-05-25T14:36:58Z","updated_at":"2026-07-22T22:25:23Z","subjects":["scanning Joule expansion microscopy (SJEM)","atomic force microscope (AFM)","Nanotechnology","Temperature measurement","Graphene","hot spots","contact effects","microelectronics"],"languages":["en"],"rights":["Copyright 2011 Kyle Grosse"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/24392","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["King, William P."]},{"key":"dc:creator","label":"Author","values":["Grosse, Kyle L."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2011-05-25T14:36:58Z","2013-05-26T10:00:24Z","2011-05"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Mechanical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["scanning Joule expansion microscopy (SJEM)","atomic force microscope (AFM)","Nanotechnology","Temperature measurement","Graphene","hot spots","contact effects","microelectronics"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2011 Kyle Grosse"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/24392"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by William Ingram (wingram2@illinois.edu) on 2011-05-25T14:41:49Z Item is restricted until 2013-05-25T14:41:28Z","Item reinstated by Sarah Shreeves (sshreeve@illinois.edu) on 2013-05-26T10:00:24Z Item was in collections: University of Illinois Dissertations and Theses (ID: 204) No. of bitstreams: 5 Grosse_Kyle.pdf.txt: 39221 bytes, checksum: 86a84f84004489145889b6598ea8a02c (MD5) Grosse_Kyle.pdf: 2239252 bytes, checksum: 1c19bc5618dbc58b05c09ead11b97b35 (MD5) license.txt: 4061 bytes, checksum: 1cf6bc7801dfa10674ae5e8a7b003c27 (MD5) Grosse_Kyle.docx: 2913243 bytes, checksum: 3ec875307d5a4b5a607cd35e8ab1e47b (MD5) Grosse_Kyle .docx: 2913243 bytes, checksum: 3ec875307d5a4b5a607cd35e8ab1e47b (MD5)","This thesis presents the development of a quantitative nanometer-scale thermal metrology technique, which is shown to obtain ~10 nm spatial and ~250 mK temperature resolution of the temperature rise of a graphene transistor. 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