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University of Illinois at Urbana-Champaign

Hydrogen concentration and temperature affect the 1/f resistance noise in niobium films

Abstract

dc:description

"The 1/f resistance fluctuations of thin Nb films was studied from 60 K to 400 K. The resistance noise came from hydrogen ions and other defects placed in the films during sputtering. Hydrogen ions cause three types of 1/f noise at different temperatures. The noise is related to internal friction phenomena such as the Gorsky effect and the Snoek effect. Near 150K, there is ""hopping noise"" caused by the movement of hydrogen ions between nearby lattice locations. Near 300K, there is ""number fluctuation noise"" due to ions diffusing in and out of the sample during a noise measurement. The number of ions within the sample fluctuates, changing the amount of electron scattering and the resistance. Both hopping noise and number fluctuations are eliminated if an electric field drains H ions out of the sample. The intensity and temperature dependence of the hopping noise and the number fluctuation noise were compared for five samples. This comparison gives information about hydrogen ion motion and film quality. At frequencies above the number fluctuation noise, there was 1/f noise with a less specific origin. This noise is reduced, but not eliminated by the application of a DC electric field. This noise showed non-Gaussian effects in some samples. The non-Gaussian noise and other effects suggest that the noise involves a complex interaction between the H ions and the Nb lattice in which the motion of ions is correlated over 10nm."

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Physics
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2011

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Nevins, Bryan Dexter
Contributors dc:contributor
  • Weissman, Michael B.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • Copyright 1991 Nevins, Bryan Dexter
Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
AAI9210937
(UMI)AAI9210937
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/19556

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Nevins, Bryan Dexter. Hydrogen concentration and temperature affect the 1/f resistance noise in niobium films. Dissertation thesis, University of Illinois at Urbana-Champaign, 2011. http://hdl.handle.net/2142/19556