University of Illinois at Urbana-Champaign
Numerical Modeling of Multi-Conductor Interconnects for High Speed Integrated Circuits
Abstract
dc:descriptionPresented here is an alternative methodology to the development of transmission line models for multi-conductor interconnects in high speed integrated circuits. The methodology starts with the assumption that per unit length (p.u.l.) transmission line parameters — i.e. p.u.l. resistance R, inductance L, capacitance C, and conductance G — have been extracted using a two-dimensional RLCG extractor. The methodology relies upon a rational fitting algorithm called VECTFIT to express the parameters as a rational function expression, a form suitable for equivalent circuit generation using a commercial circuit simulator like HSPICE. The methodology has been numerically verified and implemented in the form of some select interconnecting scenarios for typical on-chip applications. The new methodology has also been compared with the previous methodology for robustness, accuracy and computational efficacy.
Degree
thesis:*- Name thesis:degree_name
- M.S.
- Level thesis:degree_level
- Thesis
- Discipline thesis:degree_discipline
- Electrical & Computer Engr
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Sheikh, Zuhaib B.
- Contributors dc:contributor
-
- Cangellaris, Andreas C.
Subjects
dc:subject × 6Rights
dc:rights- Statement dc:rights
-
- Copyright 2010 Zuhaib B. Sheikh
- Language dc:language
- en
Identifiers
dc:identifier.*- Handle dc:identifier
- http://hdl.handle.net/2142/18390
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/18390