Distributed electrostatic discharge protection for high-speed wireline receivers

Electrostatic discharge (ESD) protection is required at the high-speed input/output (IO) interfaces of integrated circuits (ICs) to ensure reliability, but it adds loading capacitance that hinders performance. This work investigates the performance and reliability implications of distributing the ESD protection into multiple segments separated by a discrete inductor, and it is found that distributed ESD protection is an advantageous from both performance and ESD reliability perspectives. Silicon test structures that implement distributed ESD protection are fabricated and measured to validate the analytic and simulation results.

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical & Computer Engr

Grantor

University of Illinois Urbana-Champaign

Year dc:date

2025

Author dc:creator

• Drallmeier, Matthew

Contributors dc:contributor

• Rosenbaum, Elyse

• Electrostatic discharge (ESD)
• charged device model (CDM)
• human body model (HBM)

Statement dc:rights

• Copyright 2025 Matthew Drallmeier

Language dc:language

en, eng

Handle dc:identifier

https://hdl.handle.net/2142/129170

OAI record oai:identifier

https://www.ideals.illinois.edu/oai-pmh?verb=GetRecord&metadataPrefix=etdms&identifier=oai%3Awww.ideals.illinois.edu%3A2142%2F129170