{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/129170"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/129170","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Distributed electrostatic discharge protection for high-speed wireline receivers","abstract":"Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-10-19 without embargo terms","abstract_html":"Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-10-19 without embargo terms","abstract_has_math":false,"creators":["Drallmeier, Matthew"],"institution":"University of Illinois Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Electrical & Computer Engr","degree_department":null,"school":null,"contributors":["Rosenbaum, Elyse"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2025,"date_issued":"2025-02-27","date_published":"2025-02-27","updated_at":"2026-07-22T22:25:04Z","subjects":["Electrostatic discharge (ESD)","charged device model (CDM)","human body model (HBM)"],"languages":["en","eng"],"rights":["Copyright 2025 Matthew Drallmeier"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://hdl.handle.net/2142/129170","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Rosenbaum, Elyse"]},{"key":"dc:creator","label":"Author","values":["Drallmeier, Matthew"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2025-02-27","2025-05"]},{"key":"dc:type","label":"Dc Type","values":["text","Thesis"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical & Computer Engr"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Electrostatic discharge (ESD)","charged device model (CDM)","human body model (HBM)"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en","eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2025 Matthew Drallmeier"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://hdl.handle.net/2142/129170"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-10-19 without embargo terms","The student, Matthew Drallmeier, accepted the attached license on 2025-02-24 at 13:55.","The student, Matthew Drallmeier, submitted this Thesis for approval on 2025-02-24 at 13:55.","This Thesis was approved for publication on 2025-02-27 at 16:17.","DSpace SAF Submission Ingestion Package generated from Vireo submission #21649 on 2025-10-19 at 18:09:04","Electrostatic discharge (ESD) protection is required at the high-speed input/output (IO) interfaces of integrated circuits (ICs) to ensure reliability, but it adds loading capacitance that hinders performance. This work investigates the performance and reliability implications of distributing the ESD protection into multiple segments separated by a discrete inductor, and it is found that distributed ESD protection is an advantageous from both performance and ESD reliability perspectives. Silicon test structures that implement distributed ESD protection are fabricated and measured to validate the analytic and simulation results."]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Distributed electrostatic discharge protection for high-speed wireline receivers"]}]}],"canonical_facts":{"dc:contributor":["Rosenbaum, Elyse"],"dc:creator":["Drallmeier, Matthew"],"dc:date":["2025-02-27","2025-05"],"dc:description":["Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-10-19 without embargo terms","The student, Matthew Drallmeier, accepted the attached license on 2025-02-24 at 13:55.","The student, Matthew Drallmeier, submitted this Thesis for approval on 2025-02-24 at 13:55.","This Thesis was approved for publication on 2025-02-27 at 16:17.","DSpace SAF Submission Ingestion Package generated from Vireo submission #21649 on 2025-10-19 at 18:09:04","Electrostatic discharge (ESD) protection is required at the high-speed input/output (IO) interfaces of integrated circuits (ICs) to ensure reliability, but it adds loading capacitance that hinders performance. This work investigates the performance and reliability implications of distributing the ESD protection into multiple segments separated by a discrete inductor, and it is found that distributed ESD protection is an advantageous from both performance and ESD reliability perspectives. Silicon test structures that implement distributed ESD protection are fabricated and measured to validate the analytic and simulation results."],"dc:format":["application/pdf"],"dc:identifier":["https://hdl.handle.net/2142/129170"],"dc:language":["en","eng"],"dc:rights":["Copyright 2025 Matthew Drallmeier"],"dc:subject":["Electrostatic discharge (ESD)","charged device model (CDM)","human body model (HBM)"],"dc:title":["Distributed electrostatic discharge protection for high-speed wireline receivers"],"dc:type":["text","Thesis"],"thesis:degree_discipline":["Electrical & Computer Engr"],"thesis:degree_level":["Thesis"],"thesis:degree_name":["M.S."],"thesis:institution_name":["University of Illinois Urbana-Champaign"]},"updated_at":"2026-07-22T22:25:04Z"}