Investigating soft failures induced by system-level ESD

Hardware and application-level manifestations of ESD soft failures were characterized for three single-board computers. ESD events were generated following the system-level ESD standard (IEC 61000-4-2), matching real-world testing and events. Soft failures resulting from ESD were seen on all products tested. Failures associated with the peripheral ICs occur independently of the application being run; the application-dependent failures are attributed to noise at the CPU.

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical & Computer Engr

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2019

Author dc:creator

• Vora, Sandeep Gautam

Contributors dc:contributor

• Rosenbaum, Elyse

• ESD
• Soft Failures
• System-Level ESD
• IEC 61000-4-2
• Soft Failure

Statement dc:rights

• Copyright 2018 Sandeep Vora

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/102509

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/102509