{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/102509"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/102509","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Investigating soft failures induced by system-level ESD","abstract":"Hardware and application-level manifestations of ESD soft failures were characterized for three single-board computers. ESD events were generated following the system-level ESD standard (IEC 61000-4-2), matching real-world testing and events. Soft failures resulting from ESD were seen on all products tested. Failures associated with the peripheral ICs occur independently of the application being run; the application-dependent failures are attributed to noise at the CPU.","abstract_html":"Hardware and application-level manifestations of ESD soft failures were characterized for three single-board computers. ESD events were generated following the system-level ESD standard (IEC 61000-4-2), matching real-world testing and events. Soft failures resulting from ESD were seen on all products tested. Failures associated with the peripheral ICs occur independently of the application being run; the application-dependent failures are attributed to noise at the CPU.","abstract_has_math":false,"creators":["Vora, Sandeep Gautam"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Electrical & Computer Engr","degree_department":null,"school":null,"contributors":["Rosenbaum, Elyse"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2019,"date_issued":"2019-02-06T19:36:42Z","date_published":"2019-02-06T19:36:42Z","updated_at":"2026-07-22T22:24:42Z","subjects":["ESD","Soft Failures","System-Level ESD","IEC 61000-4-2","Soft Failure"],"languages":["en"],"rights":["Copyright 2018 Sandeep Vora"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/102509","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Rosenbaum, Elyse"]},{"key":"dc:creator","label":"Author","values":["Vora, Sandeep Gautam"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2019-02-06T19:36:42Z","2018-12-11","2018-12"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical & Computer Engr"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["ESD","Soft Failures","System-Level ESD","IEC 61000-4-2","Soft Failure"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2018 Sandeep Vora"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/102509"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Hardware and application-level manifestations of ESD soft failures were characterized for three single-board computers. ESD events were generated following the system-level ESD standard (IEC 61000-4-2), matching real-world testing and events. Soft failures resulting from ESD were seen on all products tested. Failures associated with the peripheral ICs occur independently of the application being run; the application-dependent failures are attributed to noise at the CPU.","Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2019-02-05 without embargo terms","The student, Sandeep Vora, accepted the attached license on 2018-12-10 at 17:23.","The student, Sandeep Vora, submitted this Thesis for approval on 2018-12-10 at 17:34.","This Thesis was approved for publication on 2018-12-11 at 10:14.","DSpace SAF Submission Ingestion Package generated from Vireo submission #13276 on 2019-02-05 at 11:16:02","Made available in DSpace on 2019-02-06T19:36:42Z (GMT). No. of bitstreams: 3 VORA-THESIS-2018.pdf: 1247932 bytes, checksum: 49a4a4b0ef86c08477716f7a8bf5164f (MD5) Vora_MS-Final.docx: 1069402 bytes, checksum: f6dfc7f9235fbbcea6da287262db74e2 (MD5) LICENSE.txt: 4209 bytes, checksum: b4d9116397a2a9cbbccc55b383aa6cf7 (MD5) Previous issue date: 2018-12-11"]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Investigating soft failures induced by system-level ESD"]}]}],"canonical_facts":{"dc:contributor":["Rosenbaum, Elyse"],"dc:creator":["Vora, Sandeep Gautam"],"dc:date":["2019-02-06T19:36:42Z","2018-12-11","2018-12"],"dc:description":["Hardware and application-level manifestations of ESD soft failures were characterized for three single-board computers. ESD events were generated following the system-level ESD standard (IEC 61000-4-2), matching real-world testing and events. Soft failures resulting from ESD were seen on all products tested. Failures associated with the peripheral ICs occur independently of the application being run; the application-dependent failures are attributed to noise at the CPU.","Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2019-02-05 without embargo terms","The student, Sandeep Vora, accepted the attached license on 2018-12-10 at 17:23.","The student, Sandeep Vora, submitted this Thesis for approval on 2018-12-10 at 17:34.","This Thesis was approved for publication on 2018-12-11 at 10:14.","DSpace SAF Submission Ingestion Package generated from Vireo submission #13276 on 2019-02-05 at 11:16:02","Made available in DSpace on 2019-02-06T19:36:42Z (GMT). No. of bitstreams: 3 VORA-THESIS-2018.pdf: 1247932 bytes, checksum: 49a4a4b0ef86c08477716f7a8bf5164f (MD5) Vora_MS-Final.docx: 1069402 bytes, checksum: f6dfc7f9235fbbcea6da287262db74e2 (MD5) LICENSE.txt: 4209 bytes, checksum: b4d9116397a2a9cbbccc55b383aa6cf7 (MD5) Previous issue date: 2018-12-11"],"dc:format":["application/pdf"],"dc:identifier":["http://hdl.handle.net/2142/102509"],"dc:language":["en"],"dc:rights":["Copyright 2018 Sandeep Vora"],"dc:subject":["ESD","Soft Failures","System-Level ESD","IEC 61000-4-2","Soft Failure"],"dc:title":["Investigating soft failures induced by system-level ESD"],"dc:type":["text"],"thesis:degree_discipline":["Electrical & Computer Engr"],"thesis:degree_level":["Thesis"],"thesis:degree_name":["M.S."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:24:42Z"}