Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 20 of 84 for “"profilometry"”.
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High precision profilometry
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1997.
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High precision stereo profilometry
Metrological data from sample surfaces can be obtained by using a variety of profilome try methods. Atomic Force Microscopy (AFM), which relies on contact inter-atomic forces to extract topographical images of a sample, is one such method that can be used on a wide range of surface types, with …
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Profilometry with volume holographic imaging
… non-contact object profile measurement (profilometry) at long working distance is important in a number of application areas, such as precise parts manufacturing, optical element grounding and polishing, adversary target identification in military, terrace profiling, etc. The Volume …
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Data processing in nanoscale profilometry
New developments on the nanoscale are taking place rapidly in many fields. Instrumentation used to measure and understand the geometry and property of the small scale structure is therefore essential. One of the most promising devices to head the measurement science into the nanoscale is the …
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A real-time multi-sensor 3D surface shape measurement system using fringe analysis
… to choose from amongst several different fringe profilometry methods and to manipulate their settings interactively. The system has been designed specifically to measure dynamic 3D human body surface shape and to act as an enabling technology for the purpose of performing Metrology Guided …
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Design and simulation of a rapid high percision profilometer
A high precision profilometry system was developed for the quality assurance inspection of twosided samples. Based on system specifications and requirements, atomic force microscopy (AFM) was determined to be the most appropriate profilometry technique. The major components of the device include: …
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Design and implementation of a high precision profilometer
A high precision profilometry system was developed primarily for the inspection of two-sided sample specimens. Based upon system specifications and requirements, it was found that the most suitable profilometry technique was atomic force microscopy (AFM). The major components of the profilometer …
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Stress and fatigue analysis of SVI-tested camshaft lobes
… microscopy, acoustic microscopy (SAM), and profilometry were used to characterize wear and fatigue, crack depth, and surface roughness, respectively. Results show cracking to occur mainly in the opening ramp of the most abusively ground cam lobes. No clear evidence was found for subsurface …
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Laser Chemical Vapor Deposition of Titanium Nitride and Process Diagnostics With Laser-Induced Fluorescence Spectroscopy
… Film thickness profiles are obtained by stylus profilometry, and film compositions are analyzed by Auger Electron Spectroscopy (AES).
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Automated visual measurement of body shape in scoliosis.
… Moire contouring and Fourier transform profilometry are investigated through practical research in the laboratory. Stereophotogrammetry, phase stepping profilometry, optical scanning and raster pattern contouring are investigated through consideration of theory and literature review. …
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Three dimensional surface texture analysis for characterisation of enamel erosion
… For the polished samples, the microhardness and profilometry confirmed that an early enamel erosion lesion was formed which was then subsequently completely remineralised. The height and functional surface texture parameters were able to successfully characterise the enamel erosion and …
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A skin surface characterization system based on capacitive image analysis
… methods, such as optical or mechanical profilometry for example, their use is quite limited primarily to the high cost of the instrumentation required, which in turn is usually cumbersome, highlighting some of the limitations for a routine based analysis. This thesis aims to investigate …
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Highly doped semiconductors for plasmonic waveguides and flat-composite gratings
… infrared spectroscopy and microscopy, surface profilometry, and infrared emissivity measurements. Samples show strong diffraction from 1D arrays of 'metal' lines patterned using the spin-on dopants.
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An investigation of the temperature distribution induced during laser chemical vapor deposition (LCVD) of titanium nitride on titanium-aluminum-vanadium
… Also, film thickness has been measured by stylus profilometry, and film composition and microstructure have been determined by Scanning Electron Microscopy (SEM), Auger Electron Spectroscopy (AES), and X-ray Photoelectron Spectroscopy (XPS).
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Sol-gel processing of RxY3-xAlyFe5-yO12 magneto-optical films
… energy dispersive x-ray spectroscopy (EDS), profilometry and optical microscopy.
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Design, Fabrication, and Characterization of an Electrostatically Actuated Microfluidic Valve
… PDMS sputtering technique in particular allows profilometry measurement of PDMS surfaces without risk of damaging the profilometer tip, a development that could allow for much more control over PDMS film thicknesses in future projects.
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Depositing highly crystalline thin film silicon for photovoltaic solar cells utilizing metal surface wave plasmas
… microscopy, transmission electron microscopy, profilometry, x-ray diffraction and Raman spectroscopy. This work comprehensively discusses and compares different analytical techniques and methodologies – a shortcoming of prior works. In addition, it is demonstrated that the MSWP system can …
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ADDITIVE MANUFACTURING OF SUPERHYDROPHOBIC STAINLESS STEEL COMPOSITES
… powder x-ray diffraction (XRD), and optical profilometry. Although the composites were successfully mixed and printed, it was found that the surfaces remained hydrophilic due to the macroscopic nature of the surface roughness created through the LP-DED printing process. The basis for this …
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System Identification of a Cantilever Beam with Interferometer Measurement Using Adaptive Filters
… already utilize laser interferometry, such as profilometry in semiconductor manufacturing, may benefit from interferometer feedback for signal processing. This study investigates the use of laser interferometry for system identification through a piezoelectrically actuated cantilevered …
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Produção, caracterização e avaliação in vitro de filmes finos de vidro niobo-fosfato por deposição a laser pulsado
… were analyzed by SEM, EDS, XPS, XRD, XRF, AFM, profilometry, scratch test, focal contact and cell proliferation and differentiation. In XPS analysis, CaNb2(P2O6) and NbOx structures were found. Crystalline phases were not identified on the films, since the glass has an amorphous structure. …
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