Near-field scanning optical microscopy with laser trapping

This thesis is concerned with a comprehensive understanding of particle-trapped near-field scanning optical microscopy. This technique is unique in that it relies on the collection of scattered evanescent waves from a sample with a laser-trapped particle. In comparison with the other forms of near-field scanning optical microscopy with a tapered fibre or a metallic needle probe, particle-trapped near-field scanning optical microscopy offers several advantages such as no need of distance control, high signal collection efficiency, and easy replacement of a particle probe. In consideration of the major problems of particle-trapped near-field scanning optical microscopy such as low signal strength and low transverse scanning speed due to the use of a dielectric particle, a two-dimensional laser-trapped metallic particle is proposed as a near-field probe for imaging.

Name dc:type.qualificationname

phd

Level dc:type.qualificationlevel

doctoral

Grantor dc:publisher.institution

Victoria University of Technology

Year dc:date.issued

2000

Author dc:creator

• Ke, Pu Chun

• 0205 Optical Physics
• School of Engineering and Science

Language dc:language

en