{"id":{"repo_id":"vu-aus","oai_identifier":"oai:eprints.vu.edu.au:15616"},"canonical_url":"https://search.dev.ndltd.org/etd/vu-aus/oai:eprints.vu.edu.au:15616","repository":{"repo_id":"vu-aus","name":"Victoria University (Australia)","base_url":"https://vuir.vu.edu.au/cgi/oai2"},"display":{"title":"Near-field scanning optical microscopy with laser trapping","abstract":"This thesis is concerned with a comprehensive understanding of particle-trapped near-field scanning optical microscopy. This technique is unique in that it relies on the collection of scattered evanescent waves from a sample with a laser-trapped particle. In comparison with the other forms of near-field scanning optical microscopy with a tapered fibre or a metallic needle probe, particle-trapped near-field scanning optical microscopy offers several advantages such as no need of distance control, high signal collection efficiency, and easy replacement of a particle probe. In consideration of the major problems of particle-trapped near-field scanning optical microscopy such as low signal strength and low transverse scanning speed due to the use of a dielectric particle, a two-dimensional laser-trapped metallic particle is proposed as a near-field probe for imaging.","abstract_html":"This thesis is concerned with a comprehensive understanding of particle-trapped near-field scanning optical microscopy. This technique is unique in that it relies on the collection of scattered evanescent waves from a sample with a laser-trapped particle. In comparison with the other forms of near-field scanning optical microscopy with a tapered fibre or a metallic needle probe, particle-trapped near-field scanning optical microscopy offers several advantages such as no need of distance control, high signal collection efficiency, and easy replacement of a particle probe. In consideration of the major problems of particle-trapped near-field scanning optical microscopy such as low signal strength and low transverse scanning speed due to the use of a dielectric particle, a two-dimensional laser-trapped metallic particle is proposed as a near-field probe for imaging.","abstract_has_math":false,"creators":["Ke, Pu Chun"],"institution":"Victoria University of Technology","degree_name":"phd","degree_level":"doctoral","degree_discipline":null,"degree_department":null,"school":null,"contributors":[],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2000,"date_issued":"2000","date_published":"2000","updated_at":"2026-07-24T06:33:15Z","subjects":["0205 Optical Physics","School of Engineering and Science"],"languages":["en"],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":null,"outbound_label":null,"outbound_source":null},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:creator","label":"Author","values":["Ke, Pu Chun"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2000"]},{"key":"dc:date.issued","label":"Date","values":["2000"]},{"key":"dc:publisher.department","label":"Dc Publisher Department","values":["School of Communications and Informatics"]},{"key":"dc:publisher.institution","label":"Dc Publisher Institution","values":["Victoria University of Technology"]},{"key":"dc:relation.isreferencedby","label":"Dc Relation Isreferencedby","values":["https://vuir.vu.edu.au/15616/"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]},{"key":"dc:type.qualificationlevel","label":"Dc Type Qualificationlevel","values":["doctoral"]},{"key":"dc:type.qualificationname","label":"Dc Type Qualificationname","values":["phd"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["0205 Optical Physics","School of Engineering and Science"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://vuir.vu.edu.au/15616/3/KE%20Pu%20Chun-thesis_nosignature.pdf"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["This thesis is concerned with a comprehensive understanding of particle-trapped near-field scanning optical microscopy. This technique is unique in that it relies on the collection of scattered evanescent waves from a sample with a laser-trapped particle. In comparison with the other forms of near-field scanning optical microscopy with a tapered fibre or a metallic needle probe, particle-trapped near-field scanning optical microscopy offers several advantages such as no need of distance control, high signal collection efficiency, and easy replacement of a particle probe. In consideration of the major problems of particle-trapped near-field scanning optical microscopy such as low signal strength and low transverse scanning speed due to the use of a dielectric particle, a two-dimensional laser-trapped metallic particle is proposed as a near-field probe for imaging."]},{"key":"dc:format","label":"Dc Format","values":["text"]},{"key":"dc:title","label":"Title","values":["Near-field scanning optical microscopy with laser trapping"]}]}],"canonical_facts":{"dc:creator":["Ke, Pu Chun"],"dc:date":["2000"],"dc:date.issued":["2000"],"dc:description.abstract":["This thesis is concerned with a comprehensive understanding of particle-trapped near-field scanning optical microscopy. This technique is unique in that it relies on the collection of scattered evanescent waves from a sample with a laser-trapped particle. In comparison with the other forms of near-field scanning optical microscopy with a tapered fibre or a metallic needle probe, particle-trapped near-field scanning optical microscopy offers several advantages such as no need of distance control, high signal collection efficiency, and easy replacement of a particle probe. In consideration of the major problems of particle-trapped near-field scanning optical microscopy such as low signal strength and low transverse scanning speed due to the use of a dielectric particle, a two-dimensional laser-trapped metallic particle is proposed as a near-field probe for imaging."],"dc:format":["text"],"dc:identifier.uri":["https://vuir.vu.edu.au/15616/3/KE%20Pu%20Chun-thesis_nosignature.pdf"],"dc:language":["en"],"dc:publisher.department":["School of Communications and Informatics"],"dc:publisher.institution":["Victoria University of Technology"],"dc:relation.isreferencedby":["https://vuir.vu.edu.au/15616/"],"dc:subject":["0205 Optical Physics","School of Engineering and Science"],"dc:title":["Near-field scanning optical microscopy with laser trapping"],"dc:type":["Thesis"],"dc:type.qualificationlevel":["doctoral"],"dc:type.qualificationname":["phd"]},"updated_at":"2026-07-24T06:33:15Z"}