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University of Illinois - Urbana-Champaign
Plasma Assisted Cleaning by Electrostatics of Insulating Nanometer Scale Contamination from Materials Used in Integrated Circuit Manufacturing
Abstract
dc:descriptionMade available in DSpace on 2017-07-06T18:55:12Z (GMT). No. of bitstreams: 3 Lytle_Wayne_M_MS.pdf: 27922220 bytes, checksum: 67faae2239adf87cba4f0a7f443a8456 (MD5) Lytle_Wayne_M_MS_ABS.pdf: 35267 bytes, checksum: 25efd85c0e399395e1a5a857fbd3a791 (MD5) license.txt: 4813 bytes, checksum: 715c4321821a960fa1a1e91d2ac7ebce (MD5) Previous issue date: 2007
Degree
thesis:*- Name thesis:degree_name
- M.S. (master's)
- Level thesis:degree_level
- Thesis
- Discipline thesis:degree_discipline
- Nuclear, Plasma, and Radiological Engineering
- Year dc:date
- 2017
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Lytle, Wayne M.
Subjects
dc:subject × 6Rights
dc:rights- Statement dc:rights
-
- Copyright 2007 Wayne M. Lytle
- Language dc:language
- en
Identifiers
dc:identifier.*- Handle dc:identifier
- http://hdl.handle.net/2142/96442
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/96442