Measurements of Secondary Electron Yield from Low-Energy Ion Interactions With Gas Covered Surfaces

Made available in DSpace on 2017-07-06T18:48:38Z (GMT). No. of bitstreams: 3 Hu_Bozhao_MS.pdf: 99116701 bytes, checksum: 67272fada3cf5d1c798b37d3a385c992 (MD5) Hu_Bozhao_MS_ABS.pdf: 638832 bytes, checksum: 6a854d3d50627da8e1f9a753adec3096 (MD5) license.txt: 4813 bytes, checksum: 715c4321821a960fa1a1e91d2ac7ebce (MD5) Previous issue date: 1990

Name thesis:degree_name

M.S. (master's)

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Nuclear, Plasma, and Radiological Engineering

Year dc:date

2017

Author dc:creator

• Hu, Bozhao

• nuclear engineering
• low-energy ion interactions
• gas covered surfaces
• secondary electron emission
• target system

Statement dc:rights

• Copyright 1994 James Lloyd Hill

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/96379

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/96379