Measurements of Secondary Electron Yield from Low-Energy Ion Interactions With Gas Covered Surfaces
type: CreativeWork
description: Made available in DSpace on 2017-07-06T18:48:38Z (GMT). No. of bitstreams: 3 Hu_Bozhao_MS.pdf: 99116701 bytes, checksum: 67272fada3cf5d1c798b37d3a385c992 (MD5) Hu_Bozhao_MS_ABS.pdf: 638832 bytes, checksum: 6a854d3d50627da8e1f9a753adec3096 (MD5) license.txt: 4813 bytes, checksum: 715c4321821a960fa1a1e91d2ac7ebce (MD5) Previous issue date: 1990
abstract: Made available in DSpace on 2017-07-06T18:48:38Z (GMT). No. of bitstreams: 3 Hu_Bozhao_MS.pdf: 99116701 bytes, checksum: 67272fada3cf5d1c798b37d3a385c992 (MD5) Hu_Bozhao_MS_ABS.pdf: 638832 bytes, checksum: 6a854d3d50627da8e1f9a753adec3096 (MD5) license.txt: 4813 bytes, checksum: 715c4321821a960fa1a1e91d2ac7ebce (MD5) Previous issue date: 1990
author: Hu, Bozhao
language: en
keywords: nuclear engineering, low-energy ion interactions, gas covered surfaces, secondary electron emission, target system
date published: 2017-07-06T18:48:38Z
date modified: 2026-07-22T22:26:37Z
provider: University of Illinois - Urbana-Champaign
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: University of Illinois - Urbana-Champaign

PropertyValue
property ID: Handle
value: http://hdl.handle.net/2142/96379