High current pulse characterization of semiconductor devices

A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100 ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical & Computer Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2016

Author dc:creator

• Thomson, Nicholas A

Contributors dc:contributor

• Rosenbaum, Elyse

• Electrostatic Discharge (ESD)
• Transmission Line-Pulse (TLP)

Statement dc:rights

• Copyright 2015 Nicholas Thomson

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/89078

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/89078