{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/89078"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/89078","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"High current pulse characterization of semiconductor devices","abstract":"A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100 ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.","abstract_html":"A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100 ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.","abstract_has_math":false,"creators":["Thomson, Nicholas A"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Electrical & Computer Engineering","degree_department":null,"school":null,"contributors":["Rosenbaum, Elyse"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2016,"date_issued":"2016-03-02T19:44:59Z","date_published":"2016-03-02T19:44:59Z","updated_at":"2026-07-22T22:26:32Z","subjects":["Electrostatic Discharge (ESD)","Transmission Line-Pulse (TLP)"],"languages":["en"],"rights":["Copyright 2015 Nicholas Thomson"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/2142/89078","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Rosenbaum, Elyse"]},{"key":"dc:creator","label":"Author","values":["Thomson, Nicholas A"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2016-03-02T19:44:59Z","2015-12-09","2015-12"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical & Computer Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Electrostatic Discharge (ESD)","Transmission Line-Pulse (TLP)"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2015 Nicholas Thomson"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["http://hdl.handle.net/2142/89078"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100 ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.","Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2016-03-02 without embargo terms","The student, Nicholas Thomson, accepted the attached license on 2015-12-08 at 18:05.","The student, Nicholas Thomson, submitted this Thesis for approval on 2015-12-08 at 18:14.","This Thesis was approved for publication on 2015-12-09 at 17:03.","DSpace SAF Submission Ingestion Package generated from Vireo submission #8977 on 2016-03-02 at 12:52:33","Made available in DSpace on 2016-03-02T19:44:59Z (GMT). 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EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.","Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2016-03-02 without embargo terms","The student, Nicholas Thomson, accepted the attached license on 2015-12-08 at 18:05.","The student, Nicholas Thomson, submitted this Thesis for approval on 2015-12-08 at 18:14.","This Thesis was approved for publication on 2015-12-09 at 17:03.","DSpace SAF Submission Ingestion Package generated from Vireo submission #8977 on 2016-03-02 at 12:52:33","Made available in DSpace on 2016-03-02T19:44:59Z (GMT). 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