Back to results

University of Illinois at Urbana-Champaign

Inheritance of Aspergillus Ear Rot and Aflatoxin Resistance From the Tex6 Corn Line

Abstract

dc:description

F$\sb1$ means deviated from the midparent value toward resistance for aflatoxin production and toward susceptibility for ear rot in both crosses. In the B73 $\times$ Tex6 cross, generation mean analysis indicated additive gene action was the most important type of gene action controlling resistance to ear rot and to aflatoxin production. Mo17 was less susceptible to both traits, so the resistance from Tex6 in crosses with Mo17 was not well defined. Broad-sense heritabilities were 58% for ear rot and 63% for aflatoxin production in the Mo17 $\times$ Tex6 cross, and 66% for ear rot and 65% for aflatoxin production in the B73 $\times$ Tex6 cross. Narrow-sense heritabilities were 39% for ear rot and 45% for aflatoxin production in the B73 $\times$ Tex6 cross. Expected gain from F$\sb3$ family selection was 11.1% for ear rot and 1.5% for aflatoxin production. Selection will be more effective within F$\sb3$ families of the B73 $\times$ Tex6 cross than F$\sb3$ families of the Mo17 $\times$ Tex6 cross, particularly in environments favorable for disease development.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Crop Sciences
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2015

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Hamblin, Andrew Maurice
Contributors dc:contributor
  • White, Donald G.

Subjects

dc:subject × 1

Rights

Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
(MiAaPQ)AAI9904475
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/85054

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Hamblin, Andrew Maurice. Inheritance of Aspergillus Ear Rot and Aflatoxin Resistance From the Tex6 Corn Line. Dissertation thesis, University of Illinois at Urbana-Champaign, 2015. http://hdl.handle.net/2142/85054