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University of Illinois at Urbana-Champaign
Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits
Abstract
dc:descriptionOur experimental results show that our algorithms have good error resolution and run-time performance as they are able to rectify designs with one, two and three errors within minutes of CPU time. In addition, our experiments suggest that diagnosis and correction of multiple design errors with input test-vector simulation is an attractive alternative to symbolic techniques. This makes our test-vector simulation based methods applicable to designs where a symbolic representation might not be available.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Computer Science
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2015
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Veneris, Andreas Georgios
- Contributors dc:contributor
-
- Hajj, Ibrahim N.
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (MiAaPQ)AAI9912408
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/81937