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University of Illinois at Urbana-Champaign
Predicting CMOS Hot Carrier Degradation in VLSI Circuits
Abstract
dc:descriptionReliability simulation of a 51-stage ring-oscillator was performed. The circuit lifetime improvement due to D2 anneal can be well estimated by the device dc lifetime improvement data.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2015
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Li, Erhong
- Contributors dc:contributor
-
- Rosenbaum, Elyse
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (MiAaPQ)AAI9953077
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/81309