Low-Spurious Analog-to-Digital Conversion Using Multi-Stage Code-Error Calibration

This thesis presents a 5-5-5-6b pipelined ADC architecture that alleviates the requirements for initial capacitor matching and residue amplifier settling accuracy. The two 5-bit MSB stages are digitally calibrated to implement a 15-bit, 5 Msample/s low-spurious ADC using 1.4 μm CMOS. A skip-and-fill algorithm with non-linear interpolation also opens up the possibility of calibrating ADCs in the background synchronously with their normal operations. Interpolation results for the background calibration are compared with the foreground calibration results. The prototype ADC exhibits a DNL of +0.75/$-$0.6 LSB, an INL of +1.77/$-$1.58 LSB, and all spurious components are suppressed to below $-$93 dB when sampled at 5 MHz. The chip occupies an active area of 27 mm$\sp2,$ and the analog part consumes 60 mW at 5 V. Memory and arithmetic units for calibration are supplied externally in testing.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Electrical Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2015

Author dc:creator

• Kwak, Sung Ung

Contributors dc:contributor

• Song, Bang-Sup

• Engineering, Electronics and Electrical

Language dc:language

eng

Identifier

(MiAaPQ)AAI9812665

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/81213