State Information-Based Solutions for Sequential Circuit Diagnosis and Testing

Identifying and understanding the capabilities of sequential untestability identification by practical ATPG algorithms is vital to areas such as ATPG-based optimization and ATPG-based verification. This research provides conditions based on the state properties of the good and the faulty machines involved to ensure that the behavior of the circuit in the presence of untestable faults, as identified by practical sequential ATPG algorithms, is not different from the good circuit. This helps alleviate problems faced with the use of such algorithms in applications where inaccuracies in the identified untestabilities are unacceptable.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Electrical Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2015

Author dc:creator

• Boppana, Vamsi

Contributors dc:contributor

• Fuchs, W. Kent

• Computer Science

Language dc:language

eng

Identifier

(MiAaPQ)AAI9812536

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/81201