Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 7 of 7 for “"Untestable Faults"”.
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Untestable Fault Identification Using Implications
Untestable faults in circuits are defects/faults for which there exists no test pattern that can either excite the fault or propagate the fault effect to an observable point, which could be either a Primary output (PO) or a scan flip-flop. The current state-of-the-art automatic test pattern …
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Static Learning for Problems in VLSI Test and Verification
… (1) Efficient identification of sequentially untestable stuck-at faults, and (2) Equivalence checking of sequential circuits. Additionally, for the dissertation, we define a new concept called multi-cycle path delay faults (M-pdf) for latch based designs with multiple clock domains, and …
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Techniques for sequential circuit automatic test generation
… system which generates tests for all detectable faults and identifies all untestable faults in the original design is necessary. The information on untestable faults could be used to add minimal design for test hardware to make these faults testable.
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State Information-Based Solutions for Sequential Circuit Diagnosis and Testing
… the behavior of the circuit in the presence of untestable faults, as identified by practical sequential ATPG algorithms, is not different from the good circuit. This helps alleviate problems faced with the use of such algorithms in applications where inaccuracies in the identified …
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ATPG and DFT Algorithms for Delay Fault Testing
… due to the possible detection of functionally untestable faults in scan-based testing. The experimental results show that our method efficiently generates a test set for functionally testable transition faults and reduces the yield loss due to overtesting of functionally untestable transition …
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Enhancing SAT-based Formal Verification Methods using Global Learning
… and show its effectiveness through additional untestable faults they help to identify. Thirdly, we propose a suite of lemmas and theorems to formalize global learning. We show through implementation that these theorems help to significantly simplify a generic CNF formula (from Formal …
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Optimization, Testing and Design-for-Testability of Flow-Based Microfluidic Biochips
… generation tools. Based on the analysis of untestable faults in the logic-circuit model, we present a design-for-testability technique that can achieve 100\% fault coverage.</p><p>Finally, this thesis presents a technique for the automated diagnosis of leakage and blockage defects. The …