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University of Illinois at Urbana-Champaign

Raman Scattering Studies of Aluminum-Gallium - Arsenide Based Semiconductor Superlattices (Phonons, Interfaces)

Abstract

dc:description

Raman scattering measurements have been made on more than twenty semiconductor superlattices, all grown by molecular beam epitaxy and based on the Al(,x)Ga(,1-x)As system. The samples consist of undoped layers with alternating values of x along the {001} direction, and have periods ranging from 20(ANGSTROM) to 200(ANGSTROM). The data include a variety of scattering geometries, temperatures, and resonant and non-resonant laser excitation.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Physics
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2015

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Colvard, Carl Edward

Subjects

dc:subject × 1

Rights

Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
(UMI)AAI8409759
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/77357

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Colvard, Carl Edward. Raman Scattering Studies of Aluminum-Gallium - Arsenide Based Semiconductor Superlattices (Phonons, Interfaces). Dissertation thesis, University of Illinois at Urbana-Champaign, 2015. http://hdl.handle.net/2142/77357