Properties of Silicon - Silicon-Dioxide Interface States in Thin-Oxide Mos (metal-Oxide Semiconductor) Structures

Eaton, Dennis Hammond

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University of Illinois at Urbana-Champaign

Properties of Silicon - Silicon-Dioxide Interface States in Thin-Oxide Mos (metal-Oxide Semiconductor) Structures

dc:creator Eaton, Dennis Hammond

thesis:degree_name Ph.D.

dc:date2015

Abstract

dc:description

Made available in DSpace on 2015-05-12T22:38:52Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 7317191.PDF: 5032878 bytes, checksum: 5a2c0456921a996696db9958e93ad39c (MD5) Previous issue date: 1972

Degree

thesis:*

Name thesis:degree_name: Ph.D.
Level thesis:degree_level: Dissertation
Discipline thesis:degree_discipline: Physics
Grantor: University of Illinois at Urbana-Champaign
Year dc:date: 2015

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Eaton, Dennis Hammond

Subjects

dc:subject × 1

Physics, Condensed Matter

Rights

Language dc:language: eng

Identifiers

dc:identifier.*

Identifier: (UMI)AAI7317191
OAI identifier oai:identifier: oai:www.ideals.illinois.edu:2142/76935

Chain of custody

source

Harvested from: University of Illinois - Urbana-Champaign
Base URL: www.ideals.illinois.edu/oai-pmh
Last updated: 2026-07-22
Source record: OAI-PMH GetRecord

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citation

Eaton, Dennis Hammond. Properties of Silicon - Silicon-Dioxide Interface States in Thin-Oxide Mos (metal-Oxide Semiconductor) Structures. Dissertation thesis, University of Illinois at Urbana-Champaign, 2015. http://hdl.handle.net/2142/76935

Properties of Silicon - Silicon-Dioxide Interface States in Thin-Oxide Mos (metal-Oxide Semiconductor) Structures

Abstract

Degree

Author and committee

Subjects

Rights

Identifiers

Chain of custody

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