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University of Illinois at Urbana-Champaign
Issues in Design for Testability and Self-Test
Abstract
dc:descriptionThis thesis presents new approaches that enhance testability at the circuit and system level, and a fault-model based aliasing analysis of signature analyzers in random testing.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2014
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Fujii, Robert
- Contributors dc:contributor
-
- Abraham, Jacob A.
Subjects
dc:subject × 1Identifiers
dc:identifier.*- Identifier
- (UMI)AAI8803045
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/69372