Generation-Recombination Noise in Gold-Doped Silicon Mos Transistors

Yau, Leopoldo Dy

Back to results

University of Illinois at Urbana-Champaign

Generation-Recombination Noise in Gold-Doped Silicon Mos Transistors

dc:creator Yau, Leopoldo Dy

thesis:degree_name Ph.D.

dc:date2014

Abstract

dc:description

Made available in DSpace on 2014-12-08T22:24:35Z (GMT). No. of bitstreams: 1 6915424.pdf: 2506667 bytes, checksum: efd71ab4aa16e113e90d49080bfb44d7 (MD5) Previous issue date: 1969

Degree

thesis:*

Name thesis:degree_name: Ph.D.
Level thesis:degree_level: Dissertation
Discipline thesis:degree_discipline: Electrical Engineering
Grantor: University of Illinois at Urbana-Champaign
Year dc:date: 2014

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Yau, Leopoldo Dy

Subjects

dc:subject × 1

Engineering, Electronics and Electrical

Identifiers

dc:identifier.*

Identifier: (UMI)AAI6915424
OAI identifier oai:identifier: oai:www.ideals.illinois.edu:2142/59703

Chain of custody

source

Harvested from: University of Illinois - Urbana-Champaign
Base URL: www.ideals.illinois.edu/oai-pmh
Last updated: 2026-07-22
Source record: OAI-PMH GetRecord

related terms

citation

Yau, Leopoldo Dy. Generation-Recombination Noise in Gold-Doped Silicon Mos Transistors. Dissertation thesis, University of Illinois at Urbana-Champaign, 2014. http://hdl.handle.net/2142/59703

Generation-Recombination Noise in Gold-Doped Silicon Mos Transistors

Abstract

Degree

Author and committee

Subjects

Identifiers

Chain of custody

More from University of Illinois - Urbana-Champaign