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University of Illinois at Urbana-Champaign

1/f surface noise in Mos transistors

Abstract

dc:description

Made available in DSpace on 2014-12-08T22:24:04Z (GMT). No. of bitstreams: 1 6706631.pdf: 2926893 bytes, checksum: 8233428a948c077c63135fb22d7a5b0e (MD5) Previous issue date: 1966

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Electrical Engineering
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2014

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Hielscher, Frank Henning

Subjects

dc:subject × 1

Identifiers

dc:identifier.*
Identifier
(UMI)AAI6706631
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/59637

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Hielscher, Frank Henning. 1/f surface noise in Mos transistors. Dissertation thesis, University of Illinois at Urbana-Champaign, 2014. http://hdl.handle.net/2142/59637