Evaluating the effect of process variation on silicon and graphene nano-ribbon based circuits

Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2012-04-21T15:49:15Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 2 Rogachev_Artem.docx: 719809 bytes, checksum: a5e99a79e062ca8794a0646df6052ac8 (MD5) Rogachev_Artem.pdf: 1216501 bytes, checksum: d834229a644dd13b04bcb31a38a44e8e (MD5)

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical & Computer Engr

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2012

Author dc:creator

• Rogachev, Artem

Contributors dc:contributor

• Chen, Deming

• Compact Modeling
• Graphene Nano Ribbons
• Statistical Static Timing Analysis
• Process Variations
• Thermal

Statement dc:rights

• Copyright Artem Rogachev

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/32079

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/32079