Investigation of the hazards of substrate current injection: transient external latchup and substrate noise coupling

Substrate current injection is the origin of external latchup and substrate noise coupling. The trigger current for external latchup depends on the duration of the trigger event. A physics-based model is provided to model the effects of aggressor to victim spacing and orientation on transient triggering of external latchup. The latchup susceptibility of standard cell based designs is also investigated. Guard rings are used to reduce latchup susceptibility and to reduce the substrate noise coupled to sensitive analog circuits. In this work, the effectiveness of different guard ring topologies for the reduction of substrate noise coupling is also investigated.

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical & Computer Engr

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Kripanidhi, Arjun

Contributors dc:contributor

• Rosenbaum, Elyse

• Latchup
• Complementary metal–oxide–semiconductor (CMOS)
• Positive-Negative-Positive-Negative (PNPN)
• transient external latchup
• substrate noise coupling

Statement dc:rights

• Copyright 2011 Arjun Kripanidhi

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/26209

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/26209