Magnetic flux flow and fluctuation effects in thim film superconductors

Critical state measurements of single and binary thin film systems have been measured as a function of transport current density, magnetic field, temperature, and degree of annealing. Results are interpreted in terms of the present understanding of the mixed state in thin films. Studies of vorteK guiding, the Hall angle in the mixed state, and ac versus dc measurement methods are reported. An unusual fluctuation effect in the resistive superconducting transition in many of our films is reported. The failure of the Aslamazov- Larkin theory to fit our resistive transition data is noted and compared with other recent experimental data on thin films.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Physics

Year dc:date

2011

Author dc:creator

• Escher, John Stuart

Contributors dc:contributor

• Ginsberg, D.M.

• magnetic flux flow
• fluctuation effects
• thin film superconductors
• critical state measurements

Statement dc:rights

• 1970 John Stuart Escher

Language dc:language

en

Identifier

6065097

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/25849