Magnetic flux flow and fluctuation effects in thim film superconductors
type: CreativeWork
description: Critical state measurements of single and binary thin film systems have been measured as a function of transport current density, magnetic field, temperature, and degree of annealing. Results are interpreted in terms of the present understanding of the mixed state in thin films. Studies of vorteK guiding, the Hall angle in the mixed state, and ac versus dc measurement methods are reported. An unusual fluctuation effect in the resistive superconducting transition in many of our films is reported. The failure of the Aslamazov- Larkin theory to fit our resistive transition data is noted and compared with other recent experimental data on thin films.
abstract: Critical state measurements of single and binary thin film systems have been measured as a function of transport current density, magnetic field, temperature, and degree of annealing. Results are interpreted in terms of the present understanding of the mixed state in thin films. Studies of vorteK guiding, the Hall angle in the mixed state, and ac versus dc measurement methods are reported. An unusual fluctuation effect in the resistive superconducting transition in many of our films is reported. The failure of the Aslamazov- Larkin theory to fit our resistive transition data is noted and compared with other recent experimental data on thin films.
author: Escher, John Stuart
language: en
keywords: magnetic flux flow, fluctuation effects, thin film superconductors, critical state measurements
date published: 2011-07-26T20:13:51Z
date modified: 2026-07-22T22:25:26Z
provider: University of Illinois - Urbana-Champaign
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: University of Illinois - Urbana-Champaign

PropertyValue
property ID: Handle
value: http://hdl.handle.net/2142/25849