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University of Illinois - Urbana-Champaign
Generation and annealing of the bulk compensating donor, peaked interface donor, donorlike turn-around trap, and oxide traps on oxidized silicon
Abstract
dc:descriptionItem marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Carolyn Mead (cmead2@illinois.edu) on 2011-06-09T14:12:57Z Item is restricted indefinitely.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Physics
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Tzou, Joseph Jengtao
- Contributors dc:contributor
-
- Sah, C.T.
Subjects
dc:subject × 4Rights
dc:rights- Statement dc:rights
-
- 1983 Joseph Jentao Tzou
- Language dc:language
- en
Identifiers
dc:identifier.*- Identifier
- 591434