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University of Illinois at Urbana-Champaign
A simulation and redesign system for circuit hot-carrier reliability
Abstract
dc:descriptionIn this thesis a computer-aided design system for CMOS VLSI circuit hot-carrier reliability estimation and redesign is presented. The system first simulates circuits to determine the critical transistors that are most susceptible to hot-carrier effect (HCE); it then estimates the impact of HCE on circuit performance and employs a combination of design modification strategies to eliminate HCE degradation on the performance.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Engineering, Electronics and Electrical
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Li, Ping-Chung
- Contributors dc:contributor
-
- Hajj, Ibrahim N.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- Copyright 1994 Li, Ping-Chung
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
AAI9503254
(UMI)AAI9503254 - OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/23705