The impact of electron traps on the transfer performance of acoustic charge transport devices

Presented in this thesis are experimental and theoretical investigations of the transfer loss in GaAs Acoustic Charge Transport (ACT) devices caused by electron traps. An experimental method employing characterization of trap parameters and measurements of frequency response and pulse degradation in ACT devices is developed for evaluating the effects of trapping loss on device performance. Experimental results are presented for measurements on standard devices and devices in which traps have been intentionally introduced using proton bombardment. A simple theory is developed for modeling trapping loss for general input signals and trap distributions. The theory is used to predict the response of the device for the special cases of periodic pulse and small signal sinusoidal input signals. Good qualitative agreement is found between the theoretical predictions and the experimental results. An increase in trap emission rates is observed in the presence of the surface acoustic wave (SAW) used to transport charge in the ACT device. The emission rate enhancement caused by the SAW is investigated through deep level transient spectroscopy (DLTS) studies, measurements on ACT devices, and a theoretical analysis of the effects of the electric fields, acoustic strains, and channel heating associated with the SAW.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Engineering, Electronics and Electrical

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Janes, David Bruce

Contributors dc:contributor

• Hoskins, Michael J.

• Engineering, Electronics and Electrical

Statement dc:rights

• Copyright 1989 Janes, David Bruce

Language dc:language

eng

Identifier

AAI8924852
(UMI)AAI8924852

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/23617