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University of Illinois at Urbana-Champaign
Probabilistic simulation for reliability and average power estimation
Abstract
dc:descriptionThe trend in the integrated circuit industry towards an ever greater miniaturization of circuit components accentuated reliability problems such as electromigration in the power buses, hot-carrier degradation of transistors, and excessive power consumption, which ultimately resulted in chip failures. This brought forward the need for simulation tools that would evaluate the susceptibility to the aforementioned hazards before the actual fabrication process.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical and Computer Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Stamoulis, Georgios Ioannis
- Contributors dc:contributor
-
- Hajj, Ibrahim N.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- Copyright 1994 Stamoulis, Georgios Ioannis
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
AAI9503329
(UMI)AAI9503329 - OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/23348