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University of Illinois at Urbana-Champaign
Statistical design of MOS VLSI circuits with designed experiments
Abstract
dc:descriptionMany methods for the statistical design and analysis of integrated circuits have been proposed over the past years. However, these methods typically require a large number of computationally expensive circuit simulator runs, and their applications are limited to small circuits.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Yu, Tat Kwan Edgar
- Contributors dc:contributor
-
- Kang, Sung Mo
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- Copyright 1989 Yu, Tat-Kwan Edgar
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
AAI9011087
(UMI)AAI9011087 - OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/23148