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University of Illinois at Urbana-Champaign

Growth and electronic properties of gallium arsenide and germanium metal insulator semiconductor structures

Abstract

dc:description

The metal insulator semiconductor (MIS) structure is arguably the most technologically important type of solid in existence. The microelectronics revolution of the last thirty years is made possible largely due to the ability to realize extremely high quality metal/SiO$\sb2$/Si metal oxide semiconductor (MOS) structures. Unfortunately, silicon does not stand out in its ability to pass charge carriers with the highest speed. Significant improvements in the performance of many areas of electronics would result if another, high mobility semiconductor could be implemented into a high quality MIS structure.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Physics
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2011

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Reed, John Charles
Contributors dc:contributor
  • Morkoc, Hadis

Subjects

dc:subject × 3

Rights

dc:rights
Statement dc:rights
  • Copyright 1994 Reed, John Charles
Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
AAI9512524
(UMI)AAI9512524
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/21134

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Reed, John Charles. Growth and electronic properties of gallium arsenide and germanium metal insulator semiconductor structures. Dissertation thesis, University of Illinois at Urbana-Champaign, 2011. http://hdl.handle.net/2142/21134