Simulation-based techniques for sequential circuit testing

Fault simulators are used extensively in the design of electronic circuits for both testing and fault diagnosis. Complex component types can be easily handled in a fault simulator, since processing occurs in the forward direction only, and various fault models can be accommodated. This research is targeted toward exploiting fault simulation for test generation, design for testability, and fault diagnosis. An existing sequential circuit fault simulator is used, and extensions to the fault simulator for these application areas are described.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Electrical Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Rudnick, Elizabeth Marie

Contributors dc:contributor

• Patel, Janak H.

• Engineering, Electronics and Electrical

Statement dc:rights

• Copyright 1994 Rudnick, Elizabeth Marie

Language dc:language

eng

Identifier

AAI9512533
(UMI)AAI9512533

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/21077