Switching density analysis for power and reliability in VLSI circuits

Advances in integrated circuit fabrication and improved computer-aided-design tools have made it possible to design and fabricate multi-million transistor integrated circuits. With such a large number of devices in a single package, new design and analysis issues have emerged. The power consumption of these giga-scale integrated circuits becomes a serious concern for packaging, heat dissipation, and energy efficiency reasons. Reliability of such complex circuits also is a serious design concern since failure of a single transistor may induce functional failure of the entire circuit. In this thesis, four key issues relating to these problems are considered.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Electrical Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Hill, Anthony Martin

Contributors dc:contributor

• Kang, Sung Mo

• Engineering, Electronics and Electrical
• Computer Science

Statement dc:rights

• Copyright 1996 Hill, Anthony Martin

Language dc:language

eng

Identifier

AAI9625144
(UMI)AAI9625144

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/19145