{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/19145"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/19145","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Switching density analysis for power and reliability in VLSI circuits","abstract":"Advances in integrated circuit fabrication and improved computer-aided-design tools have made it possible to design and fabricate multi-million transistor integrated circuits. With such a large number of devices in a single package, new design and analysis issues have emerged. The power consumption of these giga-scale integrated circuits becomes a serious concern for packaging, heat dissipation, and energy efficiency reasons. Reliability of such complex circuits also is a serious design concern since failure of a single transistor may induce functional failure of the entire circuit. In this thesis, four key issues relating to these problems are considered.","abstract_html":"Advances in integrated circuit fabrication and improved computer-aided-design tools have made it possible to design and fabricate multi-million transistor integrated circuits. With such a large number of devices in a single package, new design and analysis issues have emerged. The power consumption of these giga-scale integrated circuits becomes a serious concern for packaging, heat dissipation, and energy efficiency reasons. Reliability of such complex circuits also is a serious design concern since failure of a single transistor may induce functional failure of the entire circuit. In this thesis, four key issues relating to these problems are considered.","abstract_has_math":false,"creators":["Hill, Anthony Martin"],"institution":"University of Illinois at Urbana-Champaign","degree_name":"Ph.D.","degree_level":"Dissertation","degree_discipline":"Electrical Engineering","degree_department":null,"school":null,"contributors":["Kang, Sung Mo"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2011,"date_issued":"2011-05-07T11:58:17Z","date_published":"2011-05-07T11:58:17Z","updated_at":"2026-07-22T22:25:12Z","subjects":["Engineering, Electronics and Electrical","Computer Science"],"languages":["eng"],"rights":["Copyright 1996 Hill, Anthony Martin"],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["AAI9625144","(UMI)AAI9625144"],"render_values":[{"text":"AAI9625144","href":null,"code":true},{"text":"(UMI)AAI9625144","href":null,"code":true}]}]},"links":{"outbound_url":"http://hdl.handle.net/2142/19145","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Kang, Sung Mo"]},{"key":"dc:creator","label":"Author","values":["Hill, Anthony Martin"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2011-05-07T11:58:17Z","10000-01-01","1996"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Dissertation"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Ph.D."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois at Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Engineering, Electronics and Electrical","Computer Science"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 1996 Hill, Anthony Martin"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["AAI9625144","(UMI)AAI9625144","http://hdl.handle.net/2142/19145"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Advances in integrated circuit fabrication and improved computer-aided-design tools have made it possible to design and fabricate multi-million transistor integrated circuits. With such a large number of devices in a single package, new design and analysis issues have emerged. The power consumption of these giga-scale integrated circuits becomes a serious concern for packaging, heat dissipation, and energy efficiency reasons. Reliability of such complex circuits also is a serious design concern since failure of a single transistor may induce functional failure of the entire circuit. In this thesis, four key issues relating to these problems are considered.","First, short-circuit power consumption is considered. We present a probabilistic algorithm for the analysis of short-circuit power in VLSI designs. This technique is used to assess the significance of short-circuit power consumption during power optimization. We also analyze short-circuit power in static CMOS gates, D flip-flops, multiplexors, and tri-state I/O pads.","Second, we consider the issue of guaranteeing the final accuracy of a simulation-based switching density estimate. We propose a set of stopping criteria for a specified final accuracy. Additionally, algorithms to estimate the number of required input patterns are proposed.","Third, we address the issue of estimating maximum current and power consumption through simulation. Order statistics are used to provide statistically improved estimates for these maxima. Results are presented which provide confidence intervals on the estimated maximum values and bound typical values for both current and power.","Finally, worst-case switching density is considered. Algorithms based on the concept of single-transition intervals (STIs) are presented which can bound the maximum switching density, and extensions based on gate functionality are proposed.","Made available in DSpace on 2011-05-07T11:58:17Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9625144.pdf: 4650006 bytes, checksum: ec4156fbb150b87db5e5be5c25db1ae1 (MD5) Previous issue date: 1996","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T14:34:58Z Item is restricted indefinitely.","Restriction data tranferred 2014-07-01T11:13:36-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission","ETDs are only available to UIUC Users without author permission","U of I Only"]},{"key":"dc:title","label":"Title","values":["Switching density analysis for power and reliability in VLSI circuits"]}]}],"canonical_facts":{"dc:contributor":["Kang, Sung Mo"],"dc:creator":["Hill, Anthony Martin"],"dc:date":["2011-05-07T11:58:17Z","10000-01-01","1996"],"dc:description":["Advances in integrated circuit fabrication and improved computer-aided-design tools have made it possible to design and fabricate multi-million transistor integrated circuits. With such a large number of devices in a single package, new design and analysis issues have emerged. The power consumption of these giga-scale integrated circuits becomes a serious concern for packaging, heat dissipation, and energy efficiency reasons. Reliability of such complex circuits also is a serious design concern since failure of a single transistor may induce functional failure of the entire circuit. In this thesis, four key issues relating to these problems are considered.","First, short-circuit power consumption is considered. We present a probabilistic algorithm for the analysis of short-circuit power in VLSI designs. This technique is used to assess the significance of short-circuit power consumption during power optimization. We also analyze short-circuit power in static CMOS gates, D flip-flops, multiplexors, and tri-state I/O pads.","Second, we consider the issue of guaranteeing the final accuracy of a simulation-based switching density estimate. We propose a set of stopping criteria for a specified final accuracy. Additionally, algorithms to estimate the number of required input patterns are proposed.","Third, we address the issue of estimating maximum current and power consumption through simulation. Order statistics are used to provide statistically improved estimates for these maxima. Results are presented which provide confidence intervals on the estimated maximum values and bound typical values for both current and power.","Finally, worst-case switching density is considered. Algorithms based on the concept of single-transition intervals (STIs) are presented which can bound the maximum switching density, and extensions based on gate functionality are proposed.","Made available in DSpace on 2011-05-07T11:58:17Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9625144.pdf: 4650006 bytes, checksum: ec4156fbb150b87db5e5be5c25db1ae1 (MD5) Previous issue date: 1996","Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T14:34:58Z Item is restricted indefinitely.","Restriction data tranferred 2014-07-01T11:13:36-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission","ETDs are only available to UIUC Users without author permission","U of I Only"],"dc:identifier":["AAI9625144","(UMI)AAI9625144","http://hdl.handle.net/2142/19145"],"dc:language":["eng"],"dc:rights":["Copyright 1996 Hill, Anthony Martin"],"dc:subject":["Engineering, Electronics and Electrical","Computer Science"],"dc:title":["Switching density analysis for power and reliability in VLSI circuits"],"dc:type":["text"],"thesis:degree_discipline":["Electrical Engineering"],"thesis:degree_level":["Dissertation"],"thesis:degree_name":["Ph.D."],"thesis:institution_name":["University of Illinois at Urbana-Champaign"]},"updated_at":"2026-07-22T22:25:12Z"}