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University of Illinois at Urbana-Champaign

Recovery-driven design: Exploiting error resilience in design of energy-efficient processors

Abstract

dc:description

Conventional CAD methodologies optimize a processor module for correct operation and prohibit timing violations during nominal operation. We propose recovery-driven design, a design approach that optimizes a processor module for a target timing error rate instead of correct operation. The target error rate is chosen based on how many errors can be gainfully tolerated by a hardware or software error resilience mechanism. We show that significant power bene ts are possible from a recovery-driven design approach that deliberately allows errors caused by voltage overscaling to occur during nominal operation, while relying on an error resilience technique to tolerate these errors. We present a detailed evaluation and analysis of such a design-level methodology that minimizes the power of a processor module for a target error rate. We show how this design-level methodology can be extended to design recovery-driven processors -- processors that are optimized to take advantage of hardware or software error resilience. These may be single-core processors or heterogeneously-reliable multi-core processors, in which individual cores are optimized for different reliability targets. We also discuss a gradual slack recovery-driven design approach that optimizes for a range of error rates to create soft processors -- processors that have graceful failure characteristics and the ability to trade throughput or output quality for additional energy savings over a range of error rates. We demonstrate significant power benefits over conventional design -- 11.8% on average over all modules and error rate targets, and up to 29.1% for individual modules. Processor- level benefits are 19.0%, on average. Benefits increase when recovery-driven design is coupled with an error resilience mechanism or when the number of available voltage domains increases.

Degree

thesis:*
Name thesis:degree_name
M.S.
Level thesis:degree_level
Thesis
Discipline thesis:degree_discipline
Electrical & Computer Engr
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2011

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Sartori, John M.
Contributors dc:contributor
  • Kumar, Rakesh

Subjects

dc:subject × 3

Rights

dc:rights
Statement dc:rights
  • Copyright 2010 John M. Sartori
Language dc:language
en

Identifiers

dc:identifier.*
Handle dc:identifier
http://hdl.handle.net/2142/18286
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/18286

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Sartori, John M.. Recovery-driven design: Exploiting error resilience in design of energy-efficient processors. Thesis thesis, University of Illinois at Urbana-Champaign, 2011. http://hdl.handle.net/2142/18286