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University of Illinois Urbana-Champaign

Investigation of factors determining charged device model electrostatic discharge reliability of integrated circuits

dc:creator Drallmeier, Matthew

thesis:degree_name Ph.D.

dc:date2025

Abstract

dc:description

Submission published under a 24 month embargo labeled 'U of I Access', the embargo will last until 2027-08-01

Degree

thesis:*

Name thesis:degree_name: Ph.D.
Level thesis:degree_level: Dissertation
Discipline thesis:degree_discipline: Electrical & Computer Engr
Grantor: University of Illinois Urbana-Champaign
Year dc:date: 2025

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Drallmeier, Matthew
Contributors dc:contributor: Rosenbaum, Elyse
Schutt-Aine, Jose E
Bernhard, Jennifer T
Chen, Xu

Subjects

dc:subject × 4

Rights

dc:rights

Statement dc:rights: Copyright 2025 Matthew Drallmeier
Language dc:language: en, eng

Identifiers

dc:identifier.*

Handle dc:identifier: https://hdl.handle.net/2142/130032
OAI identifier oai:identifier: oai:www.ideals.illinois.edu:2142/130032

Chain of custody

source

Harvested from: University of Illinois - Urbana-Champaign
Base URL: www.ideals.illinois.edu/oai-pmh
Last updated: 2026-07-22
Source record: OAI-PMH GetRecord

related terms

citation

Drallmeier, Matthew. Investigation of factors determining charged device model electrostatic discharge reliability of integrated circuits. Dissertation thesis, University of Illinois Urbana-Champaign, 2025. https://hdl.handle.net/2142/130032

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