Mitigation of simultaneous switching noise by active rail clamps

In integrated circuits with large amounts of digital switching, conditions may exist such that a significant amount of simultaneous switching noise (SSN) will be present. Low-speed products such as microcontrollers use less advanced packaging technologies, increasing the amplitude of the voltage excursions created by SSN. Overvoltages can lead to reliability issues that degrade transistor lifetime. This work investigates if the overvoltages due to SSN can be mitigated using rail clamp circuits developed for on-chip protection against electrostatic discharge (ESD).

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical and Computer Engineering

Grantor

University of Illinois Urbana-Champaign

Year dc:date

2025

Author dc:creator

• Wasowicz, Alec

Contributors dc:contributor

• Rosenbaum, Elyse

• Simultaneous Switching Noise
• Electrostatic Discharge

Statement dc:rights

• Copyright 2025 Alec Wasowicz

Language dc:language

en, eng

Handle dc:identifier

https://hdl.handle.net/2142/129987

OAI record oai:identifier

https://www.ideals.illinois.edu/oai-pmh?verb=GetRecord&metadataPrefix=etdms&identifier=oai%3Awww.ideals.illinois.edu%3A2142%2F129987